For many of today’s advanced materials, analysis by Scanning Electron Microscopy (SEM) is an ideal technique for rapidly studying material
The Ultimate Tabletop Ion Mill to Produce High Quality SEM Samples
For many of today’s advanced materials, analysis by Scanning Electron Microscopy (SEM) is an ideal technique for rapidly studying material structure and properties. Fischione Instruments' Model 1061 SEM Mill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analysis.
WEBINAR: Advanced sample preparation by broad ion beam milling for EBSD analyses
Left: Raw EBSD IPF map of a zirconium sample acquired at 80 nm step size; indexing rate is 94%.
Right: Color-coded orientation contrast image of the same zirconium sample.
Tuesday, November 10, 2020 8 a.m. PST,
11 a.m. EST, 4 p.m. UTC, 5 p.m. CET
This joint Fischione Instruments/ Bruker webinar will discuss sample preparation solutions for challenging materials using Fischione Instruments’ Model 1061 SEM Mill and acquisition of high quality electron backscatter diffraction (EBSD) measurements using the Bruker e-FlashFS detector.
In this presentation, we compare EBSD results acquired on large sample areas prepared by mechanical polishing and ion milling of challenging materials. Sample types include steel, titanium, and zirconium alloys, as well as solder bumps.
Unable to attend the live webinar?
Register now and we will send you a link to view the recording at your convenience.
APP Systems Services Pte Ltd head-quartered (HQ) in Singapore is a premier sales and service provider for high technology products, in the fields of plasma, thin films (fabrication and characterization), vacuum technology, cryogenics, thermal and bioscience related technologies delivering solutions for critical processes in the semiconductor, solar, displays, data storage, optics, R & D institutions, pharmaceutical, biotech, environmental and the defence industries. We represent a stable of highly reputable brands who are world leaders in their field of expertise, such as Angstrom Engineering (Canada), SAMCO Inc. (Japan), Fischione Instruments (USA), RIBER (France) and Vertisis Technology (Singapore), just to name a few.