- Ultra-low energy ion source
- Concentrated ion beam
- Removes amorphous and implanted layers
- Post-FIB processing and milling of conventionally prepared specimens
- LN2 cooled specimen stage
Revolutionary low energy, concentrated ion beam
Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens.
Targeted, ultra-low energy NanoMilling process
The NanoMill system features gaseous ion source technology that results in ion energies as low as 50 eV and a beam size as small as 1 µm. It allows specimens to be prepared without amorphization, implantation, or redeposition. The ion beam can be targeted to a specific area of interest. A secondary electron detector is used to image the ion-induced secondary electrons that are generated from the targeted area of the specimen.
The NanoMill system is easily programmable. Adjustable ion beam energies, milling angles, specimen rotation, and cryogenic specimen cooling parameters afford maximum flexibility to ensure the optimal preparation of a wide variety of specimens. A vacuum load lock facilitates rapid specimen exchange for high-throughput applications.